Publication

Performance Analysis of GaAs DG-JLMOSFET: Impact of Gate Oxide and Its Thickness

Choudhury, P., Bhuiyan, R.U., Hasan, M.S., Sultana, S., Minim, N.T., Ahmed, N., Hasan, M.T., Islam, M.R.

Conference Paper 2022
DOI
10.1109/TENSYMP54529.2022.9864435
Publisher
Institute of Electrical and Electronics Engineers Inc.
ISBN
9781665466585
Stage
Final
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